Therefore, a test for 1-0 transition at input 3 could be xx1x → 1101. This is what was observed in the actual transition patterns; there were a few tests that detected a 1-0 transition on input 3 but ...

This approach applies a new type of test point identification to EDT (embedded deterministic test). The results we've seen with the EDT Test Point approach averages 2x to 4x reduction in test-pattern ...

Choosing the most efficient test patterns and setting coverage targets have always been a challenge, and they become ever more daunting with the addition of new types of patterns. Design for test (DFT ...

Test engineers can improve defect detection and silicon quality by applying a lot of patterns and pattern types, such as gate-exhaustive patterns, but this gets expensive.

The test uses machine learning, a type of artificial intelligence, to identify abnormal patterns of DNA fragments in the blood of patients with cancer.